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255 DUT MEMS CARD for DRAM

Product Detail Information

PHICOM's MEMS CARD is a future-oriented PROBE CARD which MEMS technology is applied to. It was developed with MEMS technology in order to complete the technological base for WHOLE WAFER TEST SOLUTION that enables to test of a whole wafer at a time, the long-cherished goal of the semiconductor IC manufacturing industry. Currently PHICOM is providing +200 DUT MEMS CARDs for DRAM, 8" wafer one-touch MEMS CARDs for NAND. Our ultimate coal is to develop a Whole Wafer Contactor that enables chipmakers to test whole 8" and 12" wafers at a time. PHICOM is also accelerating the development of a new product family in order to extend the application range of MEMS CARD to non-memory chips including LOGIC, ASIC and CPU. Using PHICOM's MEMS CARD, our customers can reduce test time and cost substantially, which results in incremental demand for the MEMS CARD.

Technical Advantage

  • Photolithography Process
  • Wet & Dry Etching Process
  • Electroplating Process
  • Bonding Process

Future Technology

  • Develop PROBE CARD of 128 DUT or higher
  • Develop PROBE CARD for FLASH MEMORY, CPU, ASIC
  • Develop 8", 12" WHOLE WAFER CONTACTOR
  • Develop WAFER LEVEL BURN IN TEST CONTACTOR